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SiCam MPX-2

This scanner was developed by SiCam to measure board stacks on the outfeed of either a vertical or horizontal gang. By using one or several of these scanners SiCam Systems is able to simultaneously scan multiple pieces in a stack to help determine and filter wane on each piece.  With this scanner you now have the ability to gain critical quality control information on each stack exiting your gang.

Using the scan data from the MPX-2 scanner we are able to show you key quality control information on each piece coming out of your gang as well as how this machine center is performing over time. Not only do you get the ability to ensure you are cutting closer to target but you can use this information to predict or schedule maintenance on your machine center.

This can also be configured to measure boards on the outfeed of an Edger. Using a scanner SiCam is able to accurately measure each piece and report back to you critical information to help improve the quality control program for you mill. Not only will you be able to monitor on size performance for each piece, you can then use this information to make target size reductions.

Through SiCam’s Wanex software we can work with your systems optimizer to ensure wane is balanced correctly Not only do you get the ability to ensure you are cutting closer to target but you can use this information to predict or schedule maintenance on your machine center.

 

 Technology:

  • Sawline tracking immediately after the machine
  • Simultaneous measurement of all pieces
  • Multiple scanners provide the best scan coverage
  • High speed, high accuracy, high reliability
  • Both horizontal and vertical applications
  • Seperate and analyze wane

 

 Applications:

Board Edger – Thickness, Width, Wane Analysis

Small Log Line – Thickness, Width, Face Analysis

Horizontal Arbor Gang – Thickness, Width, Wane Analysis

Vertical Arbor Gang – Thickness, Width, Wane Analysis